Trigger Single Event Upset - EX-0007

The attacker induces or opportunistically exploits a single-event upset (SEU), a transient bit flip or latch disturbance in logic or memory, so that software executes in a state advantageous to the attack. SEUs arise when charge is deposited at sensitive nodes by energetic particles or intense electromagnetic stimuli. An actor may time operations to coincide with natural radiation peaks or use artificial means from close range. Outcomes include corrupted stacks or tables, altered branch conditions, flipped configuration bits in FPGAs or controllers, and transient faults that push autonomy/FDIR into recovery modes with broader command acceptance. SEU exploitation is probabilistic; the technique couples repeated stimulation with careful observation of mode transitions, watchdogs, and error counters to land the system in a desired but nominal-looking state from which other actions can proceed.